The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Apr. 22, 2003
Gary L. Drescher, Cambridge, MA (US);
Pavani Kuntala, Nashua, NH (US);
Gary L. Drescher, Cambridge, MA (US);
Pavani Kuntala, Nashua, NH (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A system, method, and computer program product provides a useful measure of the accuracy of a Naïve Bayes predictive model and reduced computational expense relative to conventional techniques. A method for measuring accuracy of a Naïve Bayes predictive model comprises the steps of receiving a training dataset comprising a plurality of rows of data, building a Naïve Bayes predictive model using the training dataset, for each of at least a portion of the plurality of rows of data in the training dataset incrementally untraining the Naïve Bayes predictive model using the row of data and determining an accuracy of the incrementally untrained Naïve Bayes predictive model, and determining an aggregate accuracy of the Naïve Bayes predictive model.