The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Jan. 04, 2005
Alex Chliwnyj, Tucson, AZ (US);
Alex Chliwnyj, Tucson, AZ (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method is disclosed to calibrate a system receiving an input signal and generating an output signal. The method provides an input signal, and generates an output signal. The method establishes a sampling rate comprising a reference frequency, samples the input signal at said sampling rate, and samples the output signal at the sampling rate. The method then forms a measured input signal waveform, forms a measured output signal waveform, determines at (P) harmonics of the reference frequency the real components and the imaginary components of the measured input signal waveform, forms a filtered input signal waveform, determines at (P) harmonics of the reference frequency the real components and imaginary components of the measured output signal waveform, and forms a filtered output signal waveform. The method then calculates a transfer function comprising the mathematical relationship between the filtered output signal waveform and the filtered input signal waveform, and forms a calibration curve using that transfer function.