The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2007

Filed:

Jun. 01, 2003
Applicants:

Nitish V Thakor, Clarksville, MD (US);

Anastasios Bezerianos, Patras, GR;

Feras AL Hatib, Irvine, CA (US);

Hasan Al-nashash, Sharjah, U.A.E., AE;

Joseph Paul, Singapore, SG;

David Sherman, Parkville, MD (US);

Shanbao Tong, Baltimore, MD (US);

Santosh Venkatesha, Baltimore, MD (US);

Inventors:

Nitish V Thakor, Clarksville, MD (US);

Anastasios Bezerianos, Patras, GR;

Feras Al Hatib, Irvine, CA (US);

Hasan Al-Nashash, Sharjah, U.A.E., AE;

Joseph Paul, Singapore, SG;

David Sherman, Parkville, MD (US);

Shanbao Tong, Baltimore, MD (US);

Santosh Venkatesha, Baltimore, MD (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments include methods and apparatus for determining whether a neurological event has occurred in a subject. An apparatus includes at least one sensor adapted to sense electroencephalogram signals from the subject. The apparatus also includes an electroencephalogram acquisition module adapted to receive the electroencephalogram signals from at least one sensor, and a processing and analysis module adapted to receive signals from the electroencephalogram acquisition module and determine changes in neurological function using entropy analysis.


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