The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Dec. 07, 2004
Markus Rudolf Silvestri, Fairport, NY (US);
Surendar Jeyadev, Rochester, NY (US);
Satchidanand Mishra, Webster, NY (US);
M. John Hinckel, Rochester, NY (US);
Edward Domm, Hilton, NY (US);
James M. Markovics, Rochester, NY (US);
Markus Rudolf Silvestri, Fairport, NY (US);
Surendar Jeyadev, Rochester, NY (US);
Satchidanand Mishra, Webster, NY (US);
M. John Hinckel, Rochester, NY (US);
Edward Domm, Hilton, NY (US);
James M. Markovics, Rochester, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
The amount of lateral charge migration (LCM) on a photoreceptor is quantified by measuring the average potential of a latent image formed on the photoreceptor surface. The surface is first uniformly charged, then exposed a first time to an image. After a waiting period during which LCM may occur, the surface is exposed a second time to the image. After another waiting period, the average potential is measured. The amount of LCM may be quantified by varying the waiting periods.