The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2007

Filed:

Sep. 30, 2003
Applicants:

Tomasz J. Nowicki, Briarcliff Manor, NY (US);

Marco Martens, Groningen, NL;

Jennifer Q. Trelewicz, Gilroy, CA (US);

Timothy J. Trenary, Berthoud, CO (US);

Joan L. Mitchell, Longmont, CO (US);

Michael T. Brady, Ithaca, NY (US);

Inventors:

Tomasz J. Nowicki, Briarcliff Manor, NY (US);

Marco Martens, Groningen, NL;

Jennifer Q. Trelewicz, Gilroy, CA (US);

Timothy J. Trenary, Berthoud, CO (US);

Joan L. Mitchell, Longmont, CO (US);

Michael T. Brady, Ithaca, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for efficient scaling in the transform domain, wherein transform coefficient data is provided as an input to a data processing system and scaled in the transform domain by application of a combined matrix. Some embodiments utilize discrete cosine transform data. One embodiment of the invention generates a combined matrix for one-dimensional scaling by selecting a rational scaling factor and matrix dimension value, generating a matrix with some zero values, applying a one-dimensional inverse transform, regrouping, and applying a one-dimensional forward transform. One application of the invention performs up-scaling operations, and another performs down-scaling operations. The invention also provides for two-dimensional scaling by selecting horizontal and vertical scaling parameters and generating first and second combined matrices responsive to the parameters and combining them into a single combined matrix. The invention may also incorporate a predetermined cost function.


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