The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Aug. 31, 2004
Norimasa Ikeda, Tokyo, JP;
Nobuyoshi Ikeda, Tokyo, JP;
Norimasa Ikeda, Tokyo, JP;
Nobuyoshi Ikeda, Tokyo, JP;
Satake Corporation, Tokyo, JP;
Abstract
A color sorting apparatus capable of displaying images of granules picked up by a CCD sensor on a panel and performing sensibility control of defective granules while observing the displayed images is provided. The color sorting apparatus comprises a contour processor for outputting contour binary data from the picked-up images and a contour threshold, a first defective determination circuit for outputting the defective part of the granule having a predetermined area or more of part exceeding a first threshold in the form of first defective pixel binary data, and a second defective determination circuit for outputting the defective part of the granule having a part exceeding a second threshold being greater than the first threshold in the form of second defective pixel binary data. The first defective pixel binary data are displayed on a monitor for thin coloration. The second defective pixel binary data are displayed on a monitor for partial coloration. The, contour binary data and, the first and second defective pixel binary data are combined, and the combined data are displayed on a granule display monitor. An operator can adjust the respective thresholds while observing those displays.