The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Jun. 29, 2005
Philipp Bernhardt, Forchheim, DE;
Marcus Pfister, Bubenreuth, DE;
Rudolf Sollacher, Eching, DE;
Volker Tresp, Müchen, DE;
Philipp Bernhardt, Forchheim, DE;
Marcus Pfister, Bubenreuth, DE;
Rudolf Sollacher, Eching, DE;
Volker Tresp, Müchen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method and a suitable x-ray device () for carrying out the method are specified for effective and operationally simplified user-specific optimization of a parameter configuration (K) of an x-ray device (), said configuration comprising at least one recording parameter (U,I,t,F). It is accordingly provided that a user () is shown a plurality of reference images (V,V) for different reference parameter sets (PV) from a reference memory () in which are stored a large number of reference images (V,V) each with an associated reference parameter set (PV), that for each reference image (V,V) shown the user () submits an assessment (BM) of the image quality (V,V), and that on the basis of the submitted assessments (BM) an optimized parameter configuration (K) is created from the reference parameter sets (PV) of the reference images (V,V) shown.