The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Feb. 19, 2003
Feng Ren, Shenzhen, CN;
Zhibin Zheng, Shenzhen, CN;
Yuehua Chen, Shenzhen, CN;
Huawei Technologies Co., Ltd., Shenzhen, CN;
Abstract
The invention discloses a signal-to-interference ratio (SIR) measurement method. The method measures interference power (I) of a single-path signal after the received signal is demodulated by the single-path demodulators of multipath receiving device at the receiving end. The total interference power is obtained by equipartition combining with the measured interference power of each single-path signal. The signal power (S) is obtained by measuring after maximum ratio combination of each single-path signal. The SIR of the received signal is the division of the signal power and the total interference power. An apparatus, implementing mentioned method, sets the interference power measurement-device in the RAKE combiner and the signal power measurement-device after the RAKE combiner. In this way, the interference measurement can effectively provide more information and can more really response to the channel variation.