The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2007

Filed:

Feb. 15, 2002
Applicant:

Jürgen Müller, Hamburg, DE;

Inventor:

Jürgen Müller, Hamburg, DE;

Assignee:

Evotec AG, Hamburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A confocal microscope has a specimen holding device for holding a specimen (). The specimen () is illuminated by an illuminating unit (). An optics unit () serves to direct radiation produced by the illuminating unit () toward the specimen () and to direct the radiation emitted by the specimen toward a detector unit (). The confocal microscope also comprises an aperture diaphragm () that is placed in the beam path in front of the detector unit (). In addition, a focusing lens () is provided in the beam path in front of the aperture diaphragm (). The focusing lens () can be moved in order to adjust the confocal microscope, for example, in order to compensate for thermal stresses.


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