The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Aug. 10, 2005
Hiromi Takahashi, Koganei, JP;
Hiromi Takahashi, Koganei, JP;
System Instruments Co., Ltd., Tokyo, JP;
Abstract
The device for measuring an optical absorption characteristic of a sample according to the present invention comprising a light source, a optical wave-guide having light input surface(s) and light output surface(s) that are opposite to each other, and a light reflecting surface on which a sample to be measured is disposed, through which the light passes and is reflected by a total reflection on the sample, one or more light transmitting means arranged between the light output surface of the optical wave-guide and the light input surface of the optical wave-guide so that the light is again entered into the optical wave-guide, and a processing device which receives the light re-exited from the optical wave-guide through the output surface and detects the optical absorption characteristics of the sample on the basis of the light received, whereby the light which passes through the optical wave-guide is conducted to the optical wave-guide again, the light is again entered the optical wave-guide, and the light is again reflected on the sample (FIG.).