The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Oct. 09, 2002
Christoph Cremer, Heidelberg, DE;
Antonio Virgilio Failla, Rome, IT;
Benno Albrecht, Heidelberg, DE;
Christoph Cremer, Heidelberg, DE;
Antonio Virgilio Failla, Rome, IT;
Benno Albrecht, Heidelberg, DE;
Ruprecht-Karls-Universitat, Heidelberg, DE;
Abstract
The present invention relates to a far field light microscopical method, respectively a system and a computer program product for analysing at least one object having a subwavelength size in at least one spatial direction to obtain spatial information of the object, in particular size and topology thereof, comprising the steps of:—labelling the object(s) with one or more suitable optical markers;—providing suitably structured illumination light to at least partially illuminate the object(s);—subjecting the object(s) to the structured illumination light;—detecting an optical response of the object(s);—obtaining the spatial information of the object(s) by comparing the obtained response with simulation data of an optical response of object(s) having known spatial information.