The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Nov. 14, 2002
Applicants:
Ganesh Kamath, Bangalore, IN;
Ravishankar S. Ayyagari, Bangalore, IN;
Inventors:
Ganesh Kamath, Bangalore, IN;
Ravishankar S. Ayyagari, Bangalore, IN;
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention comprises a test set-up () and method of testing a correlated double sampling circuit (CDS) () by using a sinusoidal test signal () for measuring linearity. The present invention generates a sinusoidal signal with two accurate and known levels at two different time points, as an input to the CDS. The cosinusoidal output of the CDS is then processed using an ADC () and processor () to check the functionality and linearity of the CDS circuit under test.