The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Oct. 21, 2004
Colman Cheung, San Diego, CA (US);
Ray Schouten, San Diego, CA (US);
Stephane Cauneau, London, GB;
James Tyson, Slough, GB;
Colman Cheung, San Diego, CA (US);
Ray Schouten, San Diego, CA (US);
Stephane Cauneau, London, GB;
James Tyson, Slough, GB;
Altera Corporation, San Jose, CA (US);
Abstract
A receiving device oversamples incoming serial data using multiple phases of its system clock. The device detects an initial edge in the set of samples and selects a sample based on the location of the initial edge. A first bit is set to the value of the selected sample. A portion of the set of samples following the initial edge. If an edge is detected, then a sample is selected based upon the location of the detected edge and the next bit is set to the value of the selected sample. If an edge is not detected within this portion, then the position of the next edge is estimated. A sample is selected based upon the location of the estimated edge and the next bit is set to the value of the selected sample. The analysis is repeated for another portion of the set of samples following the newest edge.