The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Apr. 30, 2004
Chikuya Takada, Tokyo, JP;
Chikuya Takada, Tokyo, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A TFT array inspection device inspects a TFT array substrate having thin film transistors arranged in a matrix pattern. The TFT array inspection device includes a probe frame to be electrically connected to the TFT array substrate. The probe frame includes probe pins contacting array inspection electrodes to be connected to a driving electrode terminal provided in a TFT array on the TFT array substrate through wires. The probe pins are positioned at common locations relative to a layout of the TFT array substrate. Since the probe pins are located at common positions, it is possible to use a single common probe frame for the TFT array substrate with a different layout without providing or changing a prove frame corresponding to a different layout of the TFT array substrate.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile