The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7298155 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 20, 2007

Filed:

Jan. 11, 2006
Applicants:

Seiki Fuchiyama, Kumamoto, JP;

Noriyasu Kiyota, Kumamoto, JP;

Akito Kishida, Hachioji, JP;

Inventors:

Seiki Fuchiyama, Kumamoto, JP;

Noriyasu Kiyota, Kumamoto, JP;

Akito Kishida, Hachioji, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probing apparatus includes a mechanism apparatus. The mechanism apparatus includes a base body, a vibration absorber, a shifting mechanism, and a stage connected via the base body to a ground terminal. A probe, positioned over the stage, is connected to a measurement terminal of a measuring apparatus via a signal cable. The signal cable has a connecting terminal connected to the measurement terminal of the measuring apparatus. A shielding cover, positioned over a measured device on a glass substrate held on the stage, has an area not smaller than an area of the measured device and not greater than four times the area of the measured device. The shielding cover is grounded.


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Fuchiyama, Seiki. (2007). Probing apparatus (U.S. Patent No. 7298155). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7298155

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