The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Jul. 19, 2005
Glenn Baker, Edison, NJ (US);
Salvatore H. Atzeni, Edison, NJ (US);
James R. Mattheis, Edison, NJ (US);
Raymond Kaminski, Edison, NJ (US);
Glenn Baker, Edison, NJ (US);
Salvatore H. Atzeni, Edison, NJ (US);
James R. Mattheis, Edison, NJ (US);
Raymond Kaminski, Edison, NJ (US);
Horiba Jobin Yvon, Inc., Edison, NJ (US);
Abstract
An optical imager, such as a microscope for performing multiple frequency fluorometric measurements comprising a light source, such as a laser source is disclosed. The system is used to excite a sample into the fluorescent state. Light from the excited sample is collected by a microscope. The microscope utilizes conventional confocal optics optimized to have a very narrow depth of field, thus limiting the information collected to a thin planar region. Measurements are taken over the fluorescence lifetime of the sample simultaneously from the excitation source and from the excited sample. Information is taken in a matrix and comparison of the image matrix and the standard during simultaneous measurements yields output information.