The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Oct. 28, 2004
Uk Kang, Gunpo-si, KR;
Garry V. Papayan, St. Petersburg, RU;
Uk Kang, Gunpo-si, KR;
Garry V. Papayan, St. Petersburg, RU;
Korea Electrotechnology Research Institute, Gyeongsangnam-do, KR;
Abstract
The present invention relates, in general, to a fluorescence microscope and method of observing samples using the microscope and, more particularly, to a fluorescence microscope and method of observing samples using the microscope, which can reduce optical noise and obtain images with higher sensitivity, thus obtaining precise information about the density, quantity, location, etc. of a fluorophore, and which can simultaneously process separate images even when a plurality of fluorophores having different excitation and fluorescent wavelength ranges is distributed, thus easily obtaining information about the fluorophores. The fluorescence microscope of the present invention includes an objective lens, and first and third medium units. The first medium unit has a refractive index of nto accommodate one or more micro-objects including fluorophores and provide a path of excitation light to excite the fluorophores. The third medium unit has a refractive index of n, and is placed between the first medium unit and the objective lens to totally reflect the excitation light incident through the first medium unit at an interface of the third medium unit coming into contact with the first medium unit. The refractive indices of the third and first medium units satisfy a relationship of n>n.