The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Jul. 15, 2005
Walter Huber, Traunstein, DE;
Walter Huber, Traunstein, DE;
Dr. Johnannes Heidenhain GmbH, Traunreut, DE;
Abstract
A position-measuring device includes: a measuring graduation provided on a measuring standard device arranged around in ring-like fashion; a scanning unit for optically scanning the measuring graduation using electromagnetic radiation; a scanning plate with a scanning graduation, formed by a scanning grating, extending along a detection axis, which is arranged in the beam path of the electromagnetic radiation used for scanning the measuring graduation, so that the radiation interacts both with the scanning graduation and with the measuring graduation; and a detector of the scanning unit, whose detector surface is used for detecting the electromagnetic radiation after interaction with the scanning graduation and the measuring graduation and which is present as a stripe pattern, in order to record motions of the measuring standard device relative to the scanning unit. The grating constant of scanning graduation varies along the axis of extension of the scanning graduation such that the distances on which the phase of the stripe pattern present at the detector surface extends through a change by 2π, are constant.