The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Feb. 03, 2006
Masanao Fujieda, Toyohashi, JP;
Yukinobu Ban, Nishio, JP;
Masanao Fujieda, Toyohashi, JP;
Yukinobu Ban, Nishio, JP;
Nidek Co., Ltd., Aichi, JP;
Abstract
An ophthalmic measurement apparatus capable of obtaining refractive power containing a skew ray component, and further obtaining wavefront aberration from the refractive power with more ease and higher precision includes an optical system projecting slit light bundles onto a fundus of an examinee's eye and scanning the light bundles in predetermined first and second directions, an optical system with photodetectors placed in positions approximately conjugate with a cornea of the eye and placed in at least one meridian direction orthogonal to an optical axis of the photo-receiving optical system, and an arithmetic part obtaining, based on signals indicating phase differences from one of the photodetectors when photo-receiving the light bundles scanned in the first and second directions, refractive power in two directions at a corneal position corresponding to the photodetector position, and further obtains at least one of refractive power and a wavefront inclination by vector-synthesizing the obtained refractive power.