The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2007

Filed:

Feb. 04, 2005
Applicants:

Kaushik Pushpavanam, Sammamish, WA (US);

Ujjwal Sarin, Seattle, WA (US);

Inventors:

Kaushik Pushpavanam, Sammamish, WA (US);

Ujjwal Sarin, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 11/00 (2006.01); G01R 31/28 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described herein are one or more implementations for facilitation of computer software testing. One or more implementations, described herein, determine logical type of one or more test input-parameters based upon metadata placed on a function under test (FUT) of software. Using that determined logical type, an implementation generates data values. In some instances, those generated values are values selected from a repository of data values with associated logical types. The selection is based upon the determined logical type. After generating data values for testing the FUT, an implementation supplies the generated data values as input to the FUT.


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