The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2007

Filed:

Feb. 28, 2005
Applicants:

Wei-chih Wang, Sammamish, WA (US);

Per G. Reinhall, Seattle, WA (US);

Inventors:

Wei-Chih Wang, Sammamish, WA (US);

Per G. Reinhall, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to embodiments of the present invention, a distributed pressure and shear stress sensor includes a flexible substrate, such as PDMS, with a waveguide formed thereon. Along the waveguide path are several Bragg gratings. Each Bragg grating has a characteristic Bragg wavelength that shifts in response to an applied load due to elongation/compression of the grating. The wavelength shifts are monitored using a single input and a single output for the waveguide to determine the amount of applied pressure on the gratings. To measure shear stress, two flexible substrates with the waveguide and Bragg gratings are placed on top of each other such that the waveguides and gratings are perpendicular to each other. To fabricate the distributive pressure and shear sensor, a unique micro-molding technique is used wherein gratings are stamped into PDMS, for example.


Find Patent Forward Citations

Loading…