The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2007
Filed:
Sep. 30, 2003
Masaki Nakano, Tokyo, JP;
Toshiaki Iwanaga, Tokyo, JP;
Tutomu Ichimura, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A test pattern including a first test mark which is one unit-record-length longer than a shortest mark among modulating codes and a second test mark which is two or more unit-record-lengths longer than the shortest mark is recorded under a plurality of recording conditions (step S). The recorded test pattern is reproduced (step S), and based on a plurality of reproduced signals thus obtained, recording conditions allowing the first test mark and the second test mark, respectively, to be suitably recorded are selected (step S). A recording condition for the shortest mark is determined by inference based on the recording conditions of the first test mark and the second test mark.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile