The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2007

Filed:

Nov. 30, 2005
Applicants:

Bruce Russell Marshall, Santa Barbara, CA (US);

Marcus David Knudson, Albuquerque, NM (US);

Elliot Michael Burke, Goleta, CA (US);

Terrence John Davies, Santa Barbara, CA (US);

Gerald Daniel Stevens, Ventura, CA (US);

Inventors:

Bruce Russell Marshall, Santa Barbara, CA (US);

Marcus David Knudson, Albuquerque, NM (US);

Elliot Michael Burke, Goleta, CA (US);

Terrence John Davies, Santa Barbara, CA (US);

Gerald Daniel Stevens, Ventura, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention includes an interferometer for VISAR. Optionally, the present VISAR system includes intracavity imaging design with converging beams and field elements to, among other possible purposes, image the array. An optional embodiment of the present VISAR system may also optionally include precision fiber arrays. Optionally, the present system may use non-collimated beams to allow intracavity access to individual channels for one or more additional delay paths.


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