The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2007

Filed:

Oct. 21, 2005
Applicants:

Anurag Gupta, Corvallis, OR (US);

Kuohua Wu, Corvallis, OR (US);

P. Guy Howard, Junction City, OR (US);

Scott a Lerner, Corvallis, OR (US);

John Hellgeth, Corvallis, OR (US);

Terry Piper, Corvallis, OR (US);

Inventors:

Anurag Gupta, Corvallis, OR (US);

Kuohua Wu, Corvallis, OR (US);

P. Guy Howard, Junction City, OR (US);

Scott A Lerner, Corvallis, OR (US);

John Hellgeth, Corvallis, OR (US);

Terry Piper, Corvallis, OR (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of testing a coating on a reflector having a first focal point includes placing a mirror at the first focal point of the reflector and angled to orient with an area on the coating. Electromagnetic (EM) radiation is directed to the mirror which then directs the EM radiation on the area. The EM radiation which is reflected from the coating is collected onto a sensor disposed at a second focal point. The intensity of the EM radiation collected on the sensor is detected.


Find Patent Forward Citations

Loading…