The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2007
Filed:
Oct. 24, 2003
Toshimitsu Watanabe, Yokohama, JP;
Nobuaki Kabuto, Kunitachi, JP;
Mutsumi Suzuki, Kodaira, JP;
Yoshihisa Ooishi, Yokohama, JP;
Mitsuo Nakajima, Yokohama, JP;
Junichi Ikoma, Yokosuka, JP;
Toshimitsu Watanabe, Yokohama, JP;
Nobuaki Kabuto, Kunitachi, JP;
Mutsumi Suzuki, Kodaira, JP;
Yoshihisa Ooishi, Yokohama, JP;
Mitsuo Nakajima, Yokohama, JP;
Junichi Ikoma, Yokosuka, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention reduces smears arising from voltage decreases caused by the wiring resistance of scan lines for electron emission device selection. The display unit includes an FED panel in which scan lines, data lines, and electron supply devices are positioned at the intersections of the data lines and scan-lines. A scan driver for supplying a selection signal to the scan lines, and a data driver for supplying a drive signal to the data lines are provided. Electron emission devices selected by the selection signal are driven by the drive signal. A signal corrector circuit individually corrects the drive signal to be supplied to each data line to compensate for a voltage decrease caused by the wiring resistance in each column of the scan lines.