The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2007
Filed:
Apr. 07, 2005
Applicants:
Ian J. Forster, Chelmsford, GB;
Thomas C. Weakley, Simpsonville, SC (US);
Inventors:
Ian J. Forster, Chelmsford, GB;
Thomas C. Weakley, Simpsonville, SC (US);
Assignee:
Avery Dennison, Pasadena, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G08B 13/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods are disclosed herein to provide RFID device test techniques. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) device test system includes an RFID device tester adapted to test RFID devices that are disposed in a closely spaced configuration. The RFID device tester applies a variable threshold, to each of the RFID devices tested, based on characteristics of at least one of the RFID devices neighboring the RFID device being tested.