The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2007

Filed:

Sep. 03, 2004
Applicants:

John Jackson, Gainesville, GA (US);

Maksim Ershtein, Atlanta, GA (US);

Alexandre Danileiko, Suwanee, GA (US);

Curtis Evan Ide, Roswell, GA (US);

Jonathan Heller, New York, NY (US);

Inventors:

John Jackson, Gainesville, GA (US);

Maksim Ershtein, Atlanta, GA (US);

Alexandre Danileiko, Suwanee, GA (US);

Curtis Evan Ide, Roswell, GA (US);

Jonathan Heller, New York, NY (US);

Assignee:

Siemens Schweiz AG, St. Gallen, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for the classification of an object within a zone of a specified area with multiple surveillance means. The invention performs the steps of receiving a set of objects within a predefined zone area from each of at least a first and second surveillance means. Subsequently, each received set of objects is filtered to ensure that the objects in the set are comparable to the objects in the other received set. Characteristics of the received sets of objects are compared and characteristics of the objects within a received set of objects are compared to characteristics of the objects within a different set of received objects, wherein the characteristics are based upon a set of predetermined characteristics. It is determined if each object or set identified by the first surveillance means corresponds to an object or set identified by the second surveillance means.


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