The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2007
Filed:
Nov. 07, 2005
Kenichi Imura, Yasu-gun, JP;
Daiju Nakano, Sagamihara, JP;
Yoshitami Sakaguchi, Hadano, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
To test electrical characteristics of a Thin Film Transistor (TFT) with a source or drain terminal left open and exposed, using a non-contact current source and protecting the TFTs from adverse effects, such as contamination, destruction, and the like. A testeris provided to test a TFT array substrate, the tester including ion flow supply devicesandfor supplying an ion flow onto the surface of a substrate. Thereon, an arrayof TFTs is formed, each TFT being connected to an electrode having a source or a drain left open and exposed; a control circuitfor supplying an operating voltage to a gate electrode of the TFT to be tested in the array; and a measurement circuitfor measuring an operating current via the testing TFT source or drain that remain in a non open state.