The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7295003 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 13, 2007

Filed:

Sep. 22, 2004
Applicants:

Clyde T. Uyehara, Kent, WA (US);

James C. Kennedy, Renton, WA (US);

Carl B. Gifford, Buckley, WA (US);

Inventors:

Clyde T. Uyehara, Kent, WA (US);

James C. Kennedy, Renton, WA (US);

Carl B. Gifford, Buckley, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for detecting defects in the proximity of a hole of a laminate structure include inserting a generally cylindrical body portion into a hole such that a first coil of wire will reside in a plane substantially parallel to a first electrically conductive layer of the laminate material. A magnetic field produced by the first coil of wire will produce eddy-currents in the conductive layer in the plane of the first conductive layer, but damaged laminate materials will fail to produce similar eddy-currents. As the differences in eddy-currents between damages and undamaged laminate layers can be measured, damage to such laminate materials can be determined.


Find Patent Forward Citations

Uyehara, Clyde. (2007). Non-destructive testing system and method utilizing a magnetic field to identify defects in a layer of a laminated material (U.S. Patent No. 7295003). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7295003

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