The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2007

Filed:

Mar. 07, 2006
Applicant:

Yuichi Tomaru, Kanagawa-ken, JP;

Inventor:

Yuichi Tomaru, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multi-channel sensor is provided with sensor sections, each of the sensor sections reflecting or transmitting light, whose physical characteristics vary for different kinds of samples. Each of samples is supported by one of the sensor sections. A scanning mirror scans the sensor sections of the multi-channel sensor with measuring light. A scanning controller controls the scanning mirror and stores information, which represents scanning positions of the measuring light with respect to the multi-channel sensor. A detector receives reflected light or transmitted light, which is radiated out from each of the sensor sections when each of the sensor sections is scanned with the measuring light. The detector thus detects the physical characteristics of the reflected light or the transmitted light.


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