The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2007

Filed:

Aug. 06, 2004
Applicants:

Robert L. Dorney, Solana Beach, CA (US);

Joseph C. Chan, San Diego, CA (US);

Inventors:

Robert L. Dorney, Solana Beach, CA (US);

Joseph C. Chan, San Diego, CA (US);

Assignees:

Sony Corporation, Tokyo, JP;

Sony Electronics Inc., Park Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A bit error position is estimated. The estimation method includes generating data indicative of a substantial number of bit error locations in data frames. The generation of the data includes re-encoding decoded bit stream, mapping the bit stream to a first set of symbols, and determining a soft decision distance between a second set of symbols received through a data transmission channel and the first set of symbols. The generated data is then used to estimate the bit error locations. The estimation process includes capturing metric data for each bit in the data frame and obtaining derivative of the metric data. The derivative may be filtered for further processing. Error position estimation criteria may then be applied to estimate the bit error positions.


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