The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
Aug. 19, 2005
Yoshiki Kobayashi, Kanagawa, JP;
Yoshiki Kobayashi, Kanagawa, JP;
Oki Electric Industry Co., Ltd., Tokyo, JP;
Abstract
The number of S-FFs in a scan-path is decreased by half and a test time needed is decreased. An I/O terminalA is connected to a scan-path-and a combination circuitvia a selectorA and an output of the scan-path-is connected to an I/O terminalB via a selectorA and a tri-state bufferA. The I/O terminalB is connected to a scan-path-and to the combination circuitvia a selectorB and the output of the scan-path-is connected to the I/O terminalA via a selectorB and tri-state bufferB. When testing, the tri-state buffers are turned off and test-data are supplied by connecting the I/O terminalA,B to the scan-path--respectively. Thereafter, output signals of the combination circuit is applied to each S-FFand the test data are read out from the I/O terminalA,B by turning on the each tri-state bufferA,B.