The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
Sep. 13, 2004
Vicente V. Cavanna, Loomis, CA (US);
Jeffrey R. Murphy, Rocklin, CA (US);
Dylan Jackson, Roseville, CA (US);
Vicente V. Cavanna, Loomis, CA (US);
Jeffrey R. Murphy, Rocklin, CA (US);
Dylan Jackson, Roseville, CA (US);
Avago Technologies General IP (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A method of generating a test data pattern for testing a CRC algorithm, the CRC algorithm configured to generate CRC values based on a generator polynomial, the method including identifying a desired pattern of intermediate CRC values. The method includes generating a test data pattern based on the desired pattern of intermediate CRC values and the generator polynomial, wherein the test data pattern is configured to cause the CRC algorithm to generate the desired pattern of intermediate CRC values.