The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2007

Filed:

Nov. 21, 2002
Applicants:

Eric D. Dusker, Atlanta, GA (US);

Sreedhar Srikant, Marietta, GA (US);

Karen A. Papierniak, Fenton, MI (US);

Paul Cereghini, Escondido, CA (US);

Inventors:

Eric D. Dusker, Atlanta, GA (US);

Sreedhar Srikant, Marietta, GA (US);

Karen A. Papierniak, Fenton, MI (US);

Paul Cereghini, Escondido, CA (US);

Assignee:

NCR Corp., Dayton, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Report specification generators, interfaces, and methods are provided. Existing specification objects are selected from a data store. New specification objects are created as shell specification objects. Moreover, computations are selected from the data store. The specification objects, the shell specification objects, and the computations are organized within a grid. In one embodiment, the grid is used to generate a template report schema. In another embodiment, a preview tool populates the grid with report data in order to present a preview.


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