The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2007

Filed:

May. 04, 2005
Applicants:

Gerbrand Ceder, Wellesley, MA (US);

Chris Fischer, Somerville, MA (US);

Kevin Tibbetts, Winchester, MA (US);

Dane Morgan, Madison, WI (US);

Stefano Curtarolo, Durham, NC (US);

Inventors:

Gerbrand Ceder, Wellesley, MA (US);

Chris Fischer, Somerville, MA (US);

Kevin Tibbetts, Winchester, MA (US);

Dane Morgan, Madison, WI (US);

Stefano Curtarolo, Durham, NC (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G21C 17/00 (2006.01); G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for predicting features of materials of interest. Reference data are analyzed to deduce relationships between the input data sets and output data sets. Reference data includes measured values and/or computed values. The deduced relationships can be specified as equations, correspondences, and/or algorithmic processes that produce appropriate output data when suitable input data is used. In some instances, the output data set is a subset of the input data set, and computational results may be refined by optionally iterating the computational procedure. To deduce features of a new material of interest, a computed or measured input property of the material is provided to an equation, correspondence, or algorithmic procedure previously deduced, and an output is obtained. In some instances, the output is iteratively refined. In some instances, new features deduced for the material of interest are added to a database of input and output data for known materials.


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