The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
Mar. 31, 2000
Douglas J. Durrant, Mission Viejo, CA (US);
Bruce E. Aldridge, Oceanside, CA (US);
Ross E. Gough, Foothill Ranch, CA (US);
Douglas J. Durrant, Mission Viejo, CA (US);
Bruce E. Aldridge, Oceanside, CA (US);
Ross E. Gough, Foothill Ranch, CA (US);
NCR Corp., Dayton, OH (US);
Abstract
A method and system for identifying manufacturing anomalies in a manufacturing system comprising a plurality of products which are manufactured with a plurality of manufacturing parameters is disclosed. The system comprises a data mining program applied to the data warehouse for analyzing the stored manufacturing parameters to define a normal manufacturing parameter subset. The data mining program is further for detecting that at least one of the plurality of manufacturing parameters is excluded from the normal subset. The system further comprises a reporting means for reporting the at least one detected manufacturing parameter. The data mining program may further detect that a plurality of the manufacturing parameters are excluded from the first subset. The data mining program then analyzes the detected plurality of manufacturing parameters to define a second normal subset of the detected plurality of manufacturing parameters. The reporting means may then report the second normal subset of manufacturing parameters.