The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7292350 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 06, 2007

Filed:

Mar. 24, 2004
Applicants:

Frank E. Semersky, Holland, OH (US);

Daniel L. Witham, Holland, OH (US);

Stephen K. Koskie, Maumee, OH (US);

Inventors:

Frank E. Semersky, Holland, OH (US);

Daniel L. Witham, Holland, OH (US);

Stephen K. Koskie, Maumee, OH (US);

Assignee:

Plastic Technologies, Inc., Holland, OH (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for measuring a profile of an object comprising a source creating a beam of electromagnetic energy. An electromagnetic beam receiver spaced from the source for processing an output signal proportional to the girth of the object being measured. A platform for providing rotational and vertical movement of the object being measured causing the object to obstruct a portion of the electromagnetic beam generated by the source. A processor for processing the output signal from the electromagnetic beam receiver to form a composite profile of the object measured.


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