The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
Jul. 28, 2004
Thomas Zaugg, Ypsilanti, MI (US);
Thomas Zaugg, Ypsilanti, MI (US);
General Dynamics Advanced Information Systems Inc., Arlington, VA (US);
Abstract
Novel spectroscopy techniques using entangled photons are disclosed. In one technique, entangled photons are directed to a sample of interest, while the photons with which they are entangled are resolved according to frequency. The photons transmitted by or reflected from the sample and the frequency-resolved photons are detected. Such detection may be by way of an electronic coincidence counter or a biphoton sensitive material, which absorbs entangled photons while allowing other photon pairs to pass. Detection information is used to derive spectroscopic properties of the sample. In another technique, a Fourier transform spectroscopy technique using entangled photons is disclosed. Entangled photons are directed to a sample, while the photons with which they are entangled are directed to a Michelson interferometer. The photons transmitted by or reflected from the sample and the photons leaving the Michelson interferometer are detected. Such detection may be by way of an electronic coincidence counter or a biphoton sensitive material. Detection information is used to derive spectroscopic properties of the sample.