The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
Mar. 29, 2004
Klaus Gerstner, Mainz, DE;
Clemens Ottermann, Hattersheim, DE;
Thomas Zimmermann, Stukenbrock, DE;
Josef Droste, Glandorf, DE;
Klaus Gerstner, Mainz, DE;
Clemens Ottermann, Hattersheim, DE;
Thomas Zimmermann, Stukenbrock, DE;
Josef Droste, Glandorf, DE;
Schott AG, Mainz, DE;
Isra Vision Lasor GmbH, Oerling Hausen, DE;
Abstract
The method for detecting faults in transparent material includes irradiating a definite partial volume in the material with a first radiation source and coupling light into the material from a second source so that its optical path in the partial volume extends in the interior of the material. A fault in the partial volume is detected by light scattering, bright field absorption, and/or deflection of light of the first radiation source by the fault. The apparatus for detecting faults includes a first radiation source for illuminating a definite partial volume of the material, a detector for detecting light from this partial volume, and a second radiation source. The second radiation source is arranged in relation to the material so that the associated optical path in the partial volume passes exclusively in the interior of the material.