The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
Jun. 13, 2005
Martin Kithinji Kinyua, Dallas, TX (US);
William J. Bright, Dallas, TX (US);
Martin Kithinji Kinyua, Dallas, TX (US);
William J. Bright, Dallas, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
System and method for improved time-interleaved analog-to-digital converter arrays which reduces sampling mismatch distortion found in prior art arrays. There may be two causes of non-uniform sampling mismatch in a TI-ADC array, a mismatch due to skew and a mismatch due to clock jitter. To minimize non-uniform sampling mismatch, the mismatch due to skew can be addressed. A preferred embodiment comprises adjusting a delay imparted on the sampling clock by an adjustable delay in each channel of a plurality of channels in the TI-ADC array to minimize skew and randomly switching between two delays that span a zero-skew delay to reduce residual skew in each channel and thus eliminate (or reduce) frequency domain tones caused by non-uniform sampling mismatch.