The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
May. 31, 2006
Applicants:
Hossein Borsi, Hannover, DE;
Ernst Gockenbach, Burgdorf, DE;
Michael Krüger, Altach, AT;
Inventors:
Assignee:
Omicron Electronics GmbH, Klaus, AT;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 31/06 (2006.01); H01H 31/12 (2006.01);
U.S. Cl.
CPC ...
Abstract
Method and device for measuring a dielectric response of an electrical insulating system, wherein a first measurement result is determined by a frequency domain method and a second measurement result is determined by a time domain method, whereupon the first measurement result and the second measurement result are combined to form an overall measurement result as the dielectric response. Standard types of measurement methods, for example the FDS and PDC methods, may be used as measurement methods for the frequency domain and the time domain.