The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
Oct. 28, 2004
Edward E. Feikert, St. Charles, MO (US);
Nancy Wood, Clayton, MO (US);
Eugene A. Myers, St. Charles, MO (US);
Edward E. Feikert, St. Charles, MO (US);
Nancy Wood, Clayton, MO (US);
Eugene A. Myers, St. Charles, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method for detecting substructure includes the steps of: nondestructively scanning an assembly using a substructure scanning system including a precision motion carriage and a nondestructive scanning sensor, positioning the assembly under the substructure scanning system, positioning the scanning sensor on the outer skin, moving the scanning sensor over the outer skin with the precision motion carriage, locating the substructure through the outer skin, and controlling an assembly process using the location of the substructure. By using the method of the present invention substructure features may be located through an outer skin with sufficient accuracy to control assembly operations and to meet engineering tolerances. The method for precisely detecting substructure using precision eddy current scanning may be used for, but is not limited to, the location of substructure features, such as edges of flanges, machined steps, or tooling holes, covered by outer mold line skins of an aircraft airframe.