The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2007

Filed:

Sep. 01, 2005
Applicants:

Kodo Kawase, Wako, JP;

Takayuki Shibuya, Wako, JP;

Yuichi Ogawa, Wako, JP;

Masahiro Yamashita, Matsuyama, JP;

Inventors:

Kodo Kawase, Wako, JP;

Takayuki Shibuya, Wako, JP;

Yuichi Ogawa, Wako, JP;

Masahiro Yamashita, Matsuyama, JP;

Assignees:

Riken, Saitama, JP;

S-I Seiko Co., Ltd., Ehime, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is disclosed an apparatus comprising: a terahertz wave generation device which generates a terahertz wave; a terahertz wave irradiation device which irradiates an object to be inspected with the terahertz wave; and a scattering intensity detection device which cuts a rectilinear wave of the terahertz wave which has passed through the object to be inspected and which detects an intensity of a scattered wave, and a scattered material such as powder or foam contained in an envelope, a capsule, a container or the like is detected in a non-destructive manner without unsealing the envelope or the like.


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