The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2007

Filed:

Sep. 11, 2003
Applicants:

Ronald L. Hayes, Gainesville, FL (US);

Kevin K. W. Wang, Gainesville, FL (US);

Brian R. Pike, Derwood, MD (US);

Inventors:

Ronald L. Hayes, Gainesville, FL (US);

Kevin K. W. Wang, Gainesville, FL (US);

Brian R. Pike, Derwood, MD (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C07K 14/00 (2006.01); C07K 5/00 (2006.01); C07K 16/00 (2006.01); A61K 39/00 (2006.01); A61K 39/395 (2006.01); A61K 49/00 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for detecting a cell damage relate to the discovery that proteases are selectively activated in subjects suffering from nervous system damage compared to samples from healthy subjects. Breakdown products reflecting activation of proteases that degrade spectrin are produced. A cell injury is detected by providing a biological sample derived from the subject; detecting in the sample the presence of these breakdown products generated by multiple proteases, and correlating the presence of these breakdown products with the presence or type of cell damage.


Find Patent Forward Citations

Loading…