The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
Jun. 21, 2002
Jeffrey F. Miller, Santa Monica, CA (US);
Jun Huang, Los Angeles, CA (US);
Tza-huei Wang, Los Angeles, CA (US);
Chih-ming Ho, Brentwood, CA (US);
Minghsun Liu, Los Angeles, CA (US);
Jeffrey F. Miller, Santa Monica, CA (US);
Jun Huang, Los Angeles, CA (US);
Tza-Huei Wang, Los Angeles, CA (US);
Chih-Ming Ho, Brentwood, CA (US);
Minghsun Liu, Los Angeles, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
A method and system for specifically detecting perfectly matched probe-target hybrids by annealing a hairpin-based probe to a nucleic acid target under conditions favoring the formation of perfectly matched targets over mismatched targets, and electrochemically detecting the annealed probe. Sensitivity of detection can be enhanced by catalyzed reporter deposition of probe signal prior to electrochemical detection. Specificity can be enhanced by including hairpin-based competitor probes in the annealing step. The detection assay is particularly applicable to typing single nucleotide polymorphisms by DNA sandwich hybridization.