The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2007

Filed:

Apr. 09, 2004
Applicants:

Samuel Kaplan, Walworth, NY (US);

Santokh Badesha, Pittsford, NY (US);

Mark Amico, Pittsford, NY (US);

Alexander Klymachyov, Webster, NY (US);

Johan Marien Van Der Werf, Overloon, NL;

Peter Mhm Peeters, Bergen, NL;

John Connor, Berkshire, GB;

Peter Karran, Cambridgeshire, GB;

Louis D. Fratangelo, Fairport, NY (US);

Mark John Lillie, Pittsford, NY (US);

Inventors:

Samuel Kaplan, Walworth, NY (US);

Santokh Badesha, Pittsford, NY (US);

Mark Amico, Pittsford, NY (US);

Alexander Klymachyov, Webster, NY (US);

Johan Marien van der Werf, Overloon, NL;

Peter MHM Peeters, Bergen, NL;

John Connor, Berkshire, GB;

Peter Karran, Cambridgeshire, GB;

Louis D. Fratangelo, Fairport, NY (US);

Mark John Lillie, Pittsford, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03G 13/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a fuser member comprising a substrate, a layer thereover comprising a polymer or an elastomer, and, on the layer, a coating including mercapto- and amino-functionalities comprising from about 0.05 mole percent to about 1.00 mole percent mercapto groups and from about 0.0001 mole percent to about 0.06 mole percent amino groups, wherein the ratio of mercapto to amino mole percent values is at least 2. The layer preferably is a fluoropolymer or fluoroelastomer filled with a metal oxide (CuO, AlO, etc.).


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