The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2007

Filed:

Aug. 21, 2003
Applicants:

William J. Betush, Fort Worth, TX (US);

James R. Reed, Fort Worth, TX (US);

Russell G. Torti, Fort Worth, TX (US);

Inventors:

William J. Betush, Fort Worth, TX (US);

James R. Reed, Fort Worth, TX (US);

Russell G. Torti, Fort Worth, TX (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system passively identifies objects at large distances with an integrated two-dimensional pattern, spectral tailoring, and an imaging system. Encoded information allows objects of various origin and configuration to be easily and rapidly identified by optical means, but is invisible to the naked eye. The devices used for detecting the objects may be ground-based, airborne, or even satellite-based, and can track engagements of such marked objects in real-time. A tailored reflective surface at a specific wavelength band is applied to the exteriors of the objects to form a unique signature. A scanning system passively records the light emanating from the signature in the specific band, and recognizes the signature to discern what the object is based on a database of information.


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