The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2007
Filed:
May. 12, 2005
Dae-jung Kim, Seoul, KR;
Sang-jin Choi, Yongin-si, KR;
Jong-han OH, Yongin-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A substrate inspecting apparatus to inspect a substrate printed on by a print head to determine whether a printing operation is being accurately performed includes a camera unit to photograph the substrate before the substrate is printed on and to photograph the substrate after the substrate is printed on, and a control part to compare a first image of the substrate before the substrate is printed on with a second image of the substrate after the substrate is printed on through the camera unit and to determine whether the printing operation is being accurately performed on the substrate. Thus, the substrate inspecting apparatus is capable of precisely inspecting the substrate during the printing operation and reducing processing time.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile