The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2007

Filed:

Dec. 31, 2004
Applicants:

Jonathan Byrn, Kasson, MN (US);

Grant Lindberg, Pleasanton, CA (US);

Inventors:

Jonathan Byrn, Kasson, MN (US);

Grant Lindberg, Pleasanton, CA (US);

Assignee:

LSI Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and tool that capture, create, and integrate a clock specification to achieve a correct-by-construction design flow of a semiconductor product from a partially manufactured semiconductor platform. The clocking elements of the design flow are combined and displayed in a plurality of context-driven views. Within each view, details of the clock specification are presented in the context of the information. A user may zoom in/out through the plurality of views of the design flow for more or less detailed information. Each view can combine the logical, structural, architectural, cost, timing, and other features of the clock in a particular context. A user can zoom in to select and manipulate circuit elements. The user can then zoom out and the present invention determines how changes affect other clocks in the same or other modules and/or the same clock in other modules.


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