The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2007
Filed:
Aug. 31, 2004
Spencer A. Peterson, Austin, TX (US);
Richard J. Wilcox, Austin, TX (US);
Michael P. Taborn, Austin, TX (US);
Spencer A. Peterson, Austin, TX (US);
Richard J. Wilcox, Austin, TX (US);
Michael P. Taborn, Austin, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method and apparatus for capturing the internal state of an integrated circuit (IC) for second and higher order speedpath-induced failures. The method includes stretching one or more cycles of an internal clock signal in order to mask a first order speedpath-induced failure (SIF), wherein the internal clock signal is restored to operating at a normal speed subsequent to masking the first order SIF. The internal clock signal may be stopped at a cycle corresponding to a higher order SIF. After stopping the internal clock signal, test output data may be loaded into a scan chain. The method may also be used in conjunction with a laser or other device for other test enhancements.